Prof. Kai-Kit Wong
IEEE Fellow, IET Fellow
University College London, UK
Kai-Kit Wong (M'01-SM'08-F'16) received the BEng, the MPhil, and the PhD degrees, all in Electrical and Electronic Engineering, from the Hong Kong University of Science and Technology, Hong Kong, in 1996, 1998, and 2001, respectively. After graduation, he took up academic and research positions at the University of Hong Kong, Lucent Technologies, Bell-Labs, Holmdel, the Smart Antennas Research Group of Stanford University, and the University of Hull, UK. He is Chair in Wireless Communications at the Department of Electronic and Electrical Engineering, University College London, UK. His current research centers around 5G and beyond mobile communications. He is a co-recipient of the 2013 IEEE Signal Processing Letters Best Paper Award and the 2000 IEEE VTS Japan Chapter Award at the IEEE Vehicular Technology Conference in Japan in 2000, and a few other international best paper awards. He is Fellow of IEEE and IET and is also on the editorial board of several international journals. He is the Editor-in-Chief for IEEE Wireless Communications Letters since 2020.
Speech Title: NGMA: Bruce Lee Inspired Fluid Antenna Multiple Access
Abstract: “Be formless … shapeless, like water!”, which were the words used by Bruce Lee, as he was revealing the philosophy of Jeet Kune Do, the martial arts system Lee founded in 1967. Many similarities can be observed in wireless communications technologies where engineers have been seeking greater flexibility in using the spectral and energy resources for improving network performance. In this talk, I will speak on a novel antenna technology, referred to as fluid antenna, that adopts a software-controlled, position-flexible antenna to operate on the best signal envelope within a given space. This talk presents some recent results on fluid antenna systems, with an emphasis on multiple access communications. The results present an optimistic outlook for massive connectivity without the need for MIMO precoding at the base station nor multiuser detection at the users that would have been required by NOMA.
Prof. Bo Ai
IEEE Fellow, IET Fellow
Beijing Jiaotong University, China
Prof. Bo Ai (IEEE Fellow, IET Fellow) is a professor in Beijing Jiaotong University. He is the Dean of School Electronic and Information Engineering. Prof. Bo Ai has published over 160 IEEE journal articles. He has obtained 13 international paper awards include IEEE VTS Neil Shepherd Memorial Best Propagation Award and IEEE GLOBECOM 2018 Best Paper Award, 36 invention patents; 28 proposals adopted by the ITU, 3GPP, etc. He is mainly engaged in the research and application of the theory and core technology of broadband mobile communication and rail transit dedicated mobile communication systems (GSM-R, LTE-R, 5G-R, LTE-M).
Prof. Bo Ai is the Fellow of Chinese Institute of Electronics, Fellow of China Institute of Communications, Chair of IEEE BTS Xi'an Branch, Vice Chair of IEEE VTS Beijing Branch, IEEE VTS distinguished lecturer, am expert of the 5G Industry Expert Group of the China Mobile Group Technical Advisory Committee，and expert of the 6G Group in China.
Speech Title: Artificial Intelligence Enabled Wireless Propagation Channel Modeling in 6G
Abstract: The research of electromagnetic space is an important basic field of next-generation advanced information technology, which is related to technological progress and economic development. In wireless communication, radio wave propagation in electromagnetic space is the cornerstone of algorithm research, system design, and performance evaluation. The cross-integration of existing and emerging technologies represented by artificial intelligence (AI) provides a new driving force for the intelligent development of radio wave propagation. In channel feature extraction, the AI-based method can obtain more accurate channel parameters with fewer iterations, and it shows great flexibility in the application of target recognition. For environment awareness, the recognition algorithm based on neural networks can obtain accurate scene recognition results in time-varying channels, which is also conducive to realizing high-precision positioning. In channel modeling, the AI-based model can use richer environmental characteristics as input to reveal the potential mapping relationship between channel characteristics and the physical propagation environment.
Prof. Xiaoqing Wen
Kyushu Institute of Technology, Japan
Xiaoqing Wen received a B.E. degree from Tsinghua University, China, in 1986, a M.E. degree from Hiroshima University, Japan, in 1990, and a Ph.D. degree from Osaka University, Japan, in 1993. He was an Assistant Professor with Akita University, Japan, frrom 1993 to 1997, and a Visiting Researcher with the University of Wisconsin–Madison, USA, from Oct. 1995 to Mar. 1996. He joined SynTest Technologies Inc., USA, in 1998, and served as its Vice President and Chief Technology Officer until 2003. He joined Kyushu Institute of Technology, Japan, in 2003, where he is currently a Professor of the Department of Computer Science and Networks. He founded Dependable Integarted Systems Research Center at Kyushu Institute of Technology in 2013 and served as its Director until 2015. He is a Co-Founder and Co-Chair of Technical Activity Committee on Power-Aware Testing under Test Technology Technical Council (TTTC) of IEEE Computer Society. He is an Associate Editor for IEEE Transactions on Very Large Scale Integration Systems (TVLSI) and Journal of Electronic Testing: Theory and Applications (JETTA). He co-authored and co-edited two popular books, VLSI Test Principles and Architectures: Design for Testability (2006) and Power-Aware Testing and Test Strategies for Low Power Devices (2009). His research interests include design, test, and diagnosis of VLSI circuits. He holds 43 U.S. Patents and 14 Japan Patents. He received the 2008 Society Best Paper Award from the Infromation Systmes Society (ISS) of the Institute of Electronics, Information and Communication Engineers (IEICE). He is a Fellow of IEEE for his pionerring work in low capture power test generation, a Senior Member of Information Processing Society of Japan (IPSJ), and a Senior Member of IEICE.
Speech Tile: LSI Testing: A Core Technology to a Successful Semiconductor Industry
Abstract: The semiconductor industry is exposed to shrinking feature sizes, growing circuit complexity, increasing clock speeds, and decreasing power supply voltages. In addition to significant impact on LSI design and manufacturing, these factors also have a profound impact on LSI testing, a complex process for separating defective chips from defect-free ones. The major challenges to LSI testing are low test quality, high test cost, and excessive test power. These challenges have led to new chances of innovations in LSI testing, characterized by cell-aware test generation, test compression, and power-aware testing. This talk will review these challenges and chances. Furthermore, this talk will reveal the role of LSI testing in the semiconductor business chain, so as to explain why LSI testing is a core technology to a successful semiconductor industry.